QFN ATE TEST CONTACTORS

.5MM Pitch QFN ATE Test Socket

QFN ATE X-Section

 

TECHNOLOGY FEATURE SET

This revolutionary new 'wiping' action RC contact technology is a Patented Ardent Solution for ATE testing of Chipscale, QFN, MLF, MLP and other small leadless devices. RC Scrub-R technology provides:

Exceptional Signal Integrity

Long Life

Lower Component Costs

Lower Overall Costs

 

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SPECIFICATIONS

PRODUCTION PROVEN PERFORMANCE

Ardent's proprietary wire-form technology is designed for unparalleled AC performance coupled with consistent contact force throughout the life of the contact. With Ardent's all-metal technology, tight pitch area array requirements can be met without sacrificing signal integrity.

All-metal technology allows Ardent RC Springprobe™ products to offer unparalleled performance, speed, and consistency.